
| |
2200 Temperature Test System |
- Automated, software based quartz crystal temperature test
system
- Measures crystal parameters over easily defined temperature
profile
- Parameter and curve fit characteristics are checked against
easy to define QC limits
- Crystals of different frequencies can be tested in a single
temperature run
- Measurement data available in spread sheet, ASCII and
binary formats
Crystal part number defines complete measurement parameters,
QC limits, temperature test points and data printouts
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![[2200]](images/2200d.gif) |
![[Wheel]](images/2200dwhl.gif) |
- Standard dual row test wheel with extended life test
head contacts holds 254 devices
- Easily loaded S&A proprietary sockets accept HC45,
HC49, HC43, HC49US, HC18 and tubular type packages
- IEC-444 Pi Network test head with extended life contacts
and switch selected variable capacitor for load frequency measurements
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| Frequency Range: |
|
|
1 MHz - 300 MHz |
| Frequency Correlation: |
|
|
+/- 2 ppm at series, typical * |
| Crystal Power: |
|
|
10 pW - 1000 uW into 25 ohms |
| Temperature Stability: |
|
|
+/- 0.1 Degree C |
| *Proprietary measurement and calibration
algorithms provide correlation to industry standard crystal measurement equipment. |
MEASUREMENTS
ONCE PER RUN |
| Series Resonant Frequency |
|
Motional Capacitance |
|
Power Level |
| Load Resonant Frequency |
|
Motional Inductance |
|
Capacity Ratio |
| Load Capacitance |
|
Resistance |
|
Drive Level Dependency |
| Shunt Capacitance |
|
Quality Factor |
|
Spurious Testing |
|
|
Trim Sensitivity |
|
Others |
MEASUREMENTS
VERSUS TEMPERATURE |
| Series Resonant Frequency |
|
Load Resonant Frequency |
|
Resistance |
| HP E5100B Network Analyzer |
|
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IEC-444 Pi Network Test Head (dual row) |
| S&A 2451 Switch Box |
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|
Computer |
| S&A 4220 Temperature Test Chamber |
|
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System Software |
| (CO2 LN2 or MR
option) |
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|
Printer (Optional) |
- Data and Curve Fit Tabulations
- Other formats available including crystal
grouping, customer created printouts and custom.
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| 6300098-07 Copyright © 1999 Saunders & Associates, Inc. |
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