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2200B Temperature Test System

• Automated, software based quartz crystal temperature test system

• Measures crystal parameters over easily defined temperature profile

• Parameter and curve fit characteristics are checked against easy to define QC limits

• Crystals of different frequencies can be tested in a single temperature run

• Measurement data available in spread sheet, ASCII and binary formats

• Crystal part number defines complete measurement parameters, QC limits, temperature test points, and data printouts

[2200B]

• Accommodates two dual row test wheels with extended life test head contacts

• Easily loaded S&A proprietary sockets accept HC45, HC49, HC43, HC49US, HC18, SMD and tubular type packages

• Typically holds 508 devices per run

SPECIFICATIONS

Frequency Range:			1 MHz - 300 MHz
Frequency Correlation:			+/- 2 ppm at series, typical *
Crystal Power:			10 pW - 1000 uW into 25 ohms
Temperature Stability:			+/- 0.1 Degree C

*Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.

MEASUREMENTS ONCE PER RUN

Series Resonant Frequency	Motional Capacitance	Power Level
Load Resonant Frequency	Motional Inductance	Capacity Ratio
Load Capacitance	Resistance	Drive Level Dependency
Shunt Capacitance	Quality Factor	Spurious Testing
	Trim Sensitivity	Others

MEASUREMENTS VERSUS TEMPERATURE

Series Resonant Frequency

Load Resonant Frequency

Resistance

SYSTEM CONFIGURATION

HP E5100B Network Analyzer			IEC-444 Pi Network Test Head (dual row)
S&A 2451 Switch Box			Computer
S&A 4220 Temperature Test Chamber			System Software
(CO2 LN2 or MR option)			Printer (Optional)

PRINTOUT FORMATS


Data and Curve Fit Tabulations	Data and Curve Fit Plots

Other formats available including crystal grouping, customer created printouts and custom.
	List of QC Failures Only