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350A-N Quartz Crystal Test System

Features

Computer controlled quartz crystal measurement system

Performs repeatable PASS/FAIL testing to easily defined limits

Automatically adjusts to easily defined power levels

Broadband calibration

Displays and prints statistical and distribution data

Uses HP E5100B Network Anaylzer

Specifications

Frequency Range:			1 MHz - 300 MHz
Frequency Correlation:			+/- 2 ppm at series, typical *
Crystal Power:			10pW - 1000 uW into 25 ohms
Crystal Termination:			IEC-444 Standard Pi Network

*Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.

Measurements

Series Resonant Frequency	Motional Capacitance	Power Level
Load Resonant Frequency	Motional Inductance	Capacity Ratio
Load Capacitance	Resistance	Drive Level Dependency
Shunt Capacitance	Quality Factor	Spurious Testing
	Trim Sensitivity	Others

Printout Formats

Limit Testing Display Crystals are tested against user defined lower and upper limits that are displayed with each parameter tested. Crystal data for each parameter tested is displayed and a large PASS or FAIL indication is given.

All parameters outside the specified limits are clearly identified.

Distribution Display

Crystal distribution can be displayed and/or printed for all tested parameters that have limits specified in the setup file. Crystal distribution is displayed with upper and lower limits identified. The display indicates the parameter for which distribution is displayed, total number of crystals tested, mean value and standard deviation.